Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Semiconductor device evaluation method, method of controlling the semiconductor device production processes and recording medium

Semiconductor device evaluation method, method of controlling the semiconductor device production processes and recording medium

US Patent 6077719 · Granted Jun 20, 2000

Estimated economic value: $347,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Intracranial pressure estimating method and intracranial pressure estimating dev2022
Stereo camera2016
Camera unit2011
Method of estimating a lifetime of hot carrier of MOS transistor, and simulation2006
Method of estimating lifetime of semiconductor device, and method of reliability2003
Hot carrier effect simulation for integrated circuits2001
Method for forming phosphor screen1999
Thin film phototransistor and photosensor array using the same1993
Color cathode ray tube having a shadow mask covered with a porous layer1991
Method of forming color tube phosphor screen1990
Formation method and photoresist composition for phosphor screens of color pictu1990
Cathode ray tube with an electrical connecting element1990