Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of checking the accuracy of the result of a multistep etching process

Method of checking the accuracy of the result of a multistep etching process

US Patent 6077449 · Granted Jun 20, 2000

Estimated economic value: $12,231,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatuses for performing network functions in a passive optical net2017
Method for a telecommunication's network, central office, and network terminatin2014
Monitoring method for a passive optical network2014
Method for monitoring a passive optical network using monitoring units2013
Optical network, monitoring unit and monitoring method2013
Method for coordinating measurements and calibrations in a passive optical netwo2012
Optical transceiver module for monitoring an optical fiber and method for making2010
Method of checking the accuracy of the result of a multistep etching process2002
Microoptical module with a WDM filter and an optical isolator for fiber-optic am2000
Micro-optic device with means for precisely positioning micro-optic components2000
Device for the unadjusted coupling of a number of optical waveguides to a laser 1998