Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Constant resistance deep level transient spectroscopy (CR-DLTS) system and method, averging methods for DLTS, and apparatus for carrying out the methods

Constant resistance deep level transient spectroscopy (CR-DLTS) system and method, averging methods for DLTS, and apparatus for carrying out the methods

US Patent 6057701 · Granted May 2, 2000

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Vertically-aligned and conductive dummies in integrated circuit layers for capac2022
Vertically-aligned and conductive dummies in integrated circuit layers for capac2021
Transistor with gate extension to limit second gate effect2020
Back silicided variable capacitor devices2020
Bipolar junction transistor and method of fabricating the same2020
Complementary metal-oxide-semiconductor (CMOS) voltage-controlled resistor2019
Utilization of backside silicidation to form dual side contacted capacitor2019
Utilization of backside silicidation to form dual side contacted capacitor2017