Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Automatic parallel electronic component testing method and equipment

Automatic parallel electronic component testing method and equipment

US Patent 6049900 · Granted Apr 11, 2000

Estimated economic value: $94,919,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Synchronization of multiple test instruments2007
Synchronization of multiple test instruments2006
Method and equipment for automatically testing electronic components1999
Method and apparatus for automatically testing electronic components in parallel1999
Method and apparatus for automatically testing electronic components in parallel1999
Method and apparatus for automatically testing electronic components in parallel1999
Method and apparatus for selectively testing identical pins of a plurality of el1999
Method and apparatus for selectively testing identical pins of a plurality of el1999
Method and apparatus for selectively testing identical pins of a plurality of el1999