Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Focused particle beam systems and methods using a tilt column

Focused particle beam systems and methods using a tilt column

US Patent 6039000 · Granted Mar 21, 2000

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Ion sources, systems and methods2016
Systems and methods for a gas field ionization source2015
Scan method2015
Ion sources, systems and methods2015
Ion sources, systems and methods2015
Ion sources, systems and methods2014
Ion sources, systems and methods2014
Gas delivery system with voltage gradient for an ion microscope2013
Ion sources, systems and methods2013
Multiple current charged particle methods2012
Ion sources, systems and methods2012
Sample decontamination2011