Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for stress testing the memory cell oxide of a DRAM capacitor

Method for stress testing the memory cell oxide of a DRAM capacitor

US Patent 6031773 · Granted Feb 29, 2000

Estimated economic value: $42,105,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Camera focusing including lens centration estimation using variable focal length2025
Phased metalens depth of focus increase for camera focusing2025
Method and circuit for controlling generation of a boosted voltage in devices re2011
Method and apparatus for transferring data in a dual port memory2003
Circuits, systems and methods for memory mapping and display control systems usi2000
Circuits, systems and method for address mapping2000
Self boosted wordline2000
Circuits, systems and methods for memory mapping and display control systems usi2000
Multi-media processing system with wireless communication to a remote display an2000
Pre-combustion chamber assembly and method2000
Circuitry and methods for dynamically sensing of data in a static random access 1999
Circuits systems and methods for reducing power loss during transfer of data acr1998