Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wafer prober having an emissive display inspection system and method of use

Wafer prober having an emissive display inspection system and method of use

US Patent 6009187 · Granted Dec 28, 1999

Estimated economic value: $31,736,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Multi-purpose tubing apparatus2014
Feedthrough connector for implantable device2012
Biological fluid filtration system utilizing by-pass line and tube support devic2012
Multi-purpose tubing apparatus2012
Method of entertaining using a mobile entertainment environment2011
Implantable medical device assembly and manufacturing method2010
Biological fluid filtration system utilizing by-pass line and tube support devic2010
Multi-purpose tubing apparatus2009
Snap together filter2007
Snap together filter2005
Filter2003
Method and apparatus for visually inspecting an object2002