Inspection apparatus for inspecting performance of structure by inserting measuring element through gap formed therein

Assignee

• Kabushiki Kaisha Toshiba

Inventors

• Shin Murakami (41 patents)
• Tadashi Munakata (24 patents)
• Norihito Togashi (5 patents)
• Satoshi Suzuki (578 patents)
• Sueyoshi Mizuno (6 patents)
• Yoshikata Kobayashi (18 patents)
• Satoshi Irie (1 patents)
• Masanori Sotodate (1 patents)
• Katsune Zaitsu (3 patents)
• Shinji Takahashi (90 patents)
• Hideyuki Shimada (3 patents)

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