Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for in-line measuring backside wafer-level contamination of a semiconductor wafer

Method and apparatus for in-line measuring backside wafer-level contamination of a semiconductor wafer

US Patent 5930586 · Granted Jul 27, 1999

Estimated economic value: $8,771,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Message encoding and transmission across multiple platforms2025
Message encoding and transmission across multiple platforms2024
Rounded metal trace corner for stress reduction2023
Travel trailer2023
Pressure tank condensation separator2023
Message encoding and transmission across multiple platforms2023
Minimally invasive surgical apparatus and methods2022
High density interconnect structures configured for manufacturing and performanc2022
Rounded metal trace corner for stress reduction2022
Travel trailer2022
Message encoding and transmission across multiple platforms2021
High density interconnect structures configured for manufacturing and performanc2020