Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Scanning probe microscope for measuring the electrical properties of the surface of an electrically conductive sample

Scanning probe microscope for measuring the electrical properties of the surface of an electrically conductive sample

US Patent 5929643 · Granted Jul 27, 1999

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Recording device2025
Guide rail2024
Slide door driving device2024
Recording device2023
Liquid storing device and recording apparatus2022
Atomic force microscope, atomic force microscopy, and controlling method of an a2021
Printing apparatus2020
Atomic force microscope and control method of the same2018
Atomic force microscope and control method of the same2018
Scanning probe microscope and control method thereof2018
Electromagnetic shielding tube2018
Scanning mechanism and scanning probe microscope2017