Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Tester with fast refire recovery time

Tester with fast refire recovery time

US Patent 5854797 · Granted Dec 29, 1998

Estimated economic value: $51,236,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Low cost CMOS tester with edge rate compensation2002
Low cost CMOS tester with high channel density2000
CPU having pipelined instruction unit and effective address calculation unit wit1995
Memory control unit with selective execution of queued read and write requests1995
System bus having multiplexed command/ID and data1993
Multi-processor system with cache memories1992
Apparatus and method for executing a conditional branch instruction1991
Memory diagnostic apparatus and method1990
Multi-processor system with cache memories1990
Method for measuring skew or phase difference in electronic systems1987
Byte addressable memory for variable length instructions and data1987