Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test apparatus and method for testing integrated circuit modules having visual display

Test apparatus and method for testing integrated circuit modules having visual display

US Patent 5838162 · Granted Nov 17, 1998

Estimated economic value: $897,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor device with one-time programmable memory cell including anti-fuse 2015
Semiconductor device with one-time programmable memory cell including anti-fuse 2014
Semiconductor device with one-time programmable memory cell including anti-fuse 2013
Wafer alignment marks protected by photoresist2005
Photoexposure method for facilitating photoresist stripping2003
Method and apparatus for improving resist pattern developing2003
Method and apparatus for improving resist pattern developing2003
Method and apparatus for improving resist pattern developing2002
Wafer alignment marks protected by photoresist2001
Baking of photoresist on wafers2000
Acoustic wave enhanced spin coater2000
Acoustic wave enhanced developer2000