Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Single pass doublet mode integrated circuit tester

Single pass doublet mode integrated circuit tester

US Patent 5835506 · Granted Nov 10, 1998

Estimated economic value: $6,042,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Triggered integrated circuit tester2002
System for linearizing a programmable delay circuit2001
Apparatus for measuring intervals between signal edges2001
Instruction processing pattern generator controlling an integrated circuit teste2000
Algorithmic pattern generator for integrated circuit tester2000
Algorithmic pattern generator1999
Apparatus for controlling timing of signal pulses1998