{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Method and apparatus for locating and improving race conditions in VLSI integrated circuits", "item": "https://www.patentleaderboard.com/patent/5818263"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for locating and improving race conditions in VLSI integrated circuits

Method and apparatus for locating and improving race conditions in VLSI integrated circuits

US Patent 5818263 · Granted Oct 6, 1998

Estimated economic value: $51,460,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for locating critical speed paths in integrated circuits us2000
Method for locating critical speed paths in integrated circuits1999
Method and apparatus for adjusting output signals from a semiconductor device to1999
Method and apparatus for scan out testing of integrated circuits with reduced te1998
Method and apparatus for locating and improving critical speed paths in VLSI int1998
Method and apparatus for reducing clock-data skew by clock shifting1997
Delay interpolation circuitry1996