Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and method of identifying the number of chip failures on a wafer attributed to cluster failures

System and method of identifying the number of chip failures on a wafer attributed to cluster failures

US Patent 5793650 · Granted Aug 11, 1998

Estimated economic value: $23,944,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Minimization of the consumption of data processing resources in an electronic tr2025
Automated and reliable determination of a forward value associated with a future2022
Minimization of the consumption of data processing resources in an electronic tr2021