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Home › Technique for incorporating a built-in self-test (BIST) of a DRAM block with existing functional test vectors for a microprocessor

Technique for incorporating a built-in self-test (BIST) of a DRAM block with existing functional test vectors for a microprocessor

US Patent 5748640 · Granted May 5, 1998

Estimated economic value: $4,202,000 ⓘ

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