Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test head interface with vacuum-activated interconnection components

Test head interface with vacuum-activated interconnection components

US Patent 5744974 · Granted Apr 28, 1998

Estimated economic value: $15,623,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Device for programming multiple arrays of semiconductor devices1997
Device and method for programming multiple arrays of semiconductor devices1995