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Home › Device and method to measure the complex permeability of thin films at ultra-high frequencies

Device and method to measure the complex permeability of thin films at ultra-high frequencies

US Patent 5744972 · Granted Apr 28, 1998

Estimated economic value: $18,441,000 ⓘ

Assignee

AT&T

Inventors

Vladislav Korenivski (5 patents)
Zhengxiang Ma (56 patents)
Paul M. Mankiewich (6 patents)
Paul Anthony Polakos (38 patents)
Robert Bruce van Dover (26 patents)

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