Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus for holding a testing substrate in a semiconductor wafer tester and method for using the same

Apparatus for holding a testing substrate in a semiconductor wafer tester and method for using the same

US Patent 5729149 · Granted Mar 17, 1998

Estimated economic value: $8,068,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for molten oxide electrolysis2023
Multi-rotor aircraft control2019
Seal ring backup devices and methods for preventing extrusion2018
Multi-rotor aircraft2016
Pressure vessels with safety closures and associated methods and systems2012
Vehicle rear view mirror cover1998
Propellant grain assembly for a gas generator1992
Tow bar head for aircraft1983