Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Lumber defect scanning including multi-dimensional pattern recognition

Lumber defect scanning including multi-dimensional pattern recognition

US Patent 5703960 · Granted Dec 30, 1997

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Scanning system for lumber1997
Reflective grain defect scanning1993
Method for determining localized fiber angle in a three dimensional fibrous mate1986