Assignee
Inventors
- Sung Hyuk Choi (10 patents)
- Sung Eun JIN (2 patents)
- Doo-Seop Eom (13 patents)
- Je Soo Ko (49 patents)
- Jong Hyun Lee (217 patents)
{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Circuit for searching fault location in a device having a plurality of application specific integrated circuits", "item": "https://www.patentleaderboard.com/patent/5696788"}]}
Skip to contentUS Patent 5696788 · Granted Dec 9, 1997