Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test vector compression/decompression system for parallel processing integrated circuit tester

Test vector compression/decompression system for parallel processing integrated circuit tester

US Patent 5696772 · Granted Dec 9, 1997

Estimated economic value: $3,213,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System for testing real and simulated versions of an integrated circuit2001
Asynchronous integrated circuit tester2000
Self-calibrating programmable phase shifter1999
Parallel processing integrated circuit tester1999
Parallel processing integrated circuit tester1999
Parallel processing integrated circuit tester1999
Parallel processing integrated circuit tester1998
Timing signal generator1997
Precise and agile timing signal generator based on a retriggered oscillator1996
Retriggered oscillator for jitter-free phase locked loop frequency synthesis1994
Phased locked loop to provide precise frequency and phase tracking of two signal1990