Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › High speed serial data pin for automatic test equipment

High speed serial data pin for automatic test equipment

US Patent 5689515 · Granted Nov 18, 1997

Estimated economic value: $46,605,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Identifying failures in device cores2025
Bus synchronization system that aggregates status2021
Jitter measurement algorithm using locally in-order strobes2010
Jitter frequency determining system2009
Determining frequency components of jitter2009
Determining frequency components of jitter2008
Enhanced loopback testing of serial devices2008
Enhanced loopback testing of serial devices2006
Deskewed differential detector employing analog-to-digital converter2005
Pre-conditioner for measuring high-speed time intervals over a low-bandwidth pat2003
Method for capturing digital data in an automatic test system1999
Time linearity measurement using a frequency locked, dual sequencer automatic te1997