Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Scanning reflection electron diffraction microscope

Scanning reflection electron diffraction microscope

US Patent 5675148 · Granted Oct 7, 1997

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

X-ray detector monitoring device2020
X-ray generator and X-ray analyzer2019
X-ray diffraction device and sensitivity calibration method for X-ray diffractio2018
X-ray analyzer2017
Magnetic immersion lense with detection arrangement2003
Detector for diffracted electrons1995
Ion scattering spectroscope1994
Method of manufacturing battery plate groups1986