Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Semiconductor testing apparatus, semiconductor testing circuit chip, and probe card

Semiconductor testing apparatus, semiconductor testing circuit chip, and probe card

US Patent 5666049 · Granted Sep 9, 1997

Estimated economic value: $95,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Marking system and marking method2024
Data management system and management method2024
Work management system and work management method2024
Data management system, management method, and storage medium2024
Semiconductor device and manufacturing method, and electronic appliance2024
Actuator control device2023
Actuator control device2022
Semiconductor device and manufacturing method, and electronic appliance2022
Parallel processing apparatus, and method of maintaining parallel processing app2021
Bag-in-box2021
Manufacturing method of honeycomb structure forming die, and honeycomb structure2020
Semiconductor device and manufacturing method, and electronic appliance2020