{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Prescaler IC testing method and test probe card", "item": "https://www.patentleaderboard.com/patent/5604447"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Prescaler IC testing method and test probe card

Prescaler IC testing method and test probe card

US Patent 5604447 · Granted Feb 18, 1997

Estimated economic value: $18,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Optical transmitter1999
Optical transmitter1999
Optical transmission method and optical transmission apparatus1998
Prescaler IC test method capable of executing alternate current test by the use 1997
Optical trunk transmission system and an optical repeater circuit1995
High frequency amplifier1995
Optical trunk transmission system and an optical repeater circuit1995
Optical regenerative-repeater system1995
Timing extracting method suitable for a high bit-rate transmission system and a 1992
Negative feedback amplifier having GaAs FET's1985