Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Tester for integrated circuits

Tester for integrated circuits

US Patent 5596282 · Granted Jan 21, 1997

Estimated economic value: $7,710,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method for analyzing electronic devices having opposing thermal compo2018
System and method for analyzing electronic devices having opposing thermal compo2015
System and method for analyzing electronic devices having a cab for holding elec2013
Interconnecting assembly with conductive lever portions on a support film2011
Method of constructing an interposer2007
Method and system for laser marking an article2006
Method and apparatus for assembling electronics2005
Test socket interposer2004
Sensor probe2003
High density electrical connector assembly and connector for use therewith2001
Circuit for eliminating metastable events associated with a data signal asynchro1991