Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wafer burn-in test circuit of a semiconductor memory device

Wafer burn-in test circuit of a semiconductor memory device

US Patent 5590079 · Granted Dec 31, 1996

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Production process for hydrogen-enriched slush LNG fuel and device2025
Method for evaluating defective region of wafer2024
Method, apparatus, and computer program for estimating speed of vehicle passing 2020
Method of identifying defect regions in wafer2020
Wafer and wafer defect analysis method2020
Wafer and wafer defect analysis method2019
Method and apparatus for analyzing shape of wafer2018
Semiconductor memory device and method of outputting data strobe signal thereof2007
Memory device having high bus efficiency of network, operating method of the sam2005
Method of generating initializing signal in semiconductor memory device2005
Integrated circuit memory devices that utilize indication signals to increase re2002
Semiconductor memory device having data masking pin and memory system including 2002