Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System, apparatus and/or method for analyzing light intensities of light reflected from a surface of a sample

System, apparatus and/or method for analyzing light intensities of light reflected from a surface of a sample

US Patent 5461481 · Granted Oct 24, 1995

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Linear wave motion conveyor2016
Mobile oil sands mining system2015
Full-aperture, back-illuminated, uniform-scene for remote sensing optical payloa2014
Mobile oil sands mining system2011
Mobile oil sands mining system2011
Integrated disc inspection and repair apparatus and appertaining method2006
Solid/gas carbon dioxide spray cleaning system1998
Method for cleaning surface by heating and a stream of snow1994
Optical motion picture film inspection system1987
Film inspection system1987
Film inspection system1987
Film thickness detection system1981