Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Point-diffraction interferometer utilizing separate reference and signal beam paths

Point-diffraction interferometer utilizing separate reference and signal beam paths

US Patent 5457533 · Granted Oct 10, 1995

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and system for imaging a target2016
Method for extracting optical energy from an optical beam2016
Agile conformal scanner2016
Anti-reflection nanostructure array and method2015
Fiber optic probe scatterometers for spectroscopy measurements2013
Fiber optic probe scatterometer for spectroscopy measurements2012
Full hemisphere bi-directional reflectance distribution function instrument2011
Low-temperature adjustable blackbody apparatus2009
Hybrid RF/optical communication system with deployable optics and atmosphere com2008
Lenslet/detector array assembly for high data rate optical communications2007
Turbidimeter with non-imaging optical concentrator1999
Passive, gravity referencing, fluid damped, two stage pendulum optical mount1993