Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus for and method of measuring geometric, positional and kinematic parameters of a rotating device having a plurality of interval markers

Apparatus for and method of measuring geometric, positional and kinematic parameters of a rotating device having a plurality of interval markers

US Patent 5432339 · Granted Jul 11, 1995

Estimated economic value: $1,989,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Adjustable pedestal2025
Adjustable pedestal2025
Respiratory therapy unit with non-contact sensing and control2024
Louvre window2024
Charger integration-based virtual CT detector2021
Method and apparatus to reduce radiation emissions on a parcel scanning system2021
Computed tomography (CT) security inspection system with enhanced X-ray shieldin2020
Method and apparatus for performing multi-energy (including dual energy) compute2019
Controller and user interface device, systems, and methods2019
Data transfer across a rotating boundary of a computed tomography imaging appara2019
Controller and user interface device, systems, and methods2018
Hybrid photon counting data acquisition system2018