Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Testing integrated circuits provided on a carrier

Testing integrated circuits provided on a carrier

US Patent 5430735 · Granted Jul 4, 1995

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Connection test method2001
Apparatus for testing a fixed logic value interconnection between integrated cir2000
Method of testing a connection which includes a conductor in an integrated circu1999
Method of testing a connection which includes a conductor in an integrated circu1999
Testable circuit1998
Device for testing multiple pulling resistor connections using a single test poi1997
Testing integrated circuits provided on a carrier1997
Testing integrated circuits provided on a carrier1997
Electronic module comprising a first substrate element with a functional part, a1990
Electronic module comprising a first substrate element with a functional part, a1990
Testable carriers for integrated circuits1989
Integrated circuits, carriers therefor and testing apparatus and method for the 1988