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Home › Method and apparatus for electron beam focusing adjustment by electrostatic control of the distribution of beam-generated positive ions in a scanning electron beam computed tomography scanner

Method and apparatus for electron beam focusing adjustment by electrostatic control of the distribution of beam-generated positive ions in a scanning electron beam computed tomography scanner

US Patent 5386445 · Granted Jan 31, 1995

Estimated economic value: $1,562,000 ⓘ

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