Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Single device under test (DUT) port common reference/matching impedance cirtuit for the detection and location of DUT faults

Single device under test (DUT) port common reference/matching impedance cirtuit for the detection and location of DUT faults

US Patent 5363049 · Granted Nov 8, 1994

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Modular banknote apparatus2020
Securable banknote carrier, and a banknote handling apparatus and banknote casse2016
Instrument for measuring the frequency and power of a microwave signal1995
Instrument for measuring the frequency and power of a microwave signal1995
Microwave frequency synthesizer having selectable oscillator sources and output 1993
Attenuator switchably coupled to transmission path and means for switchably brea1991
Connector1990
Six-port reflectometer test arrangement and method including calibration1989
Six-port reflectometer test arrangement1988
Six-port reflectometer1987