Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for electrically testing a semiconductor die using a test apparatus having an independent conductive plane

Method for electrically testing a semiconductor die using a test apparatus having an independent conductive plane

US Patent 5330919 · Granted Jul 19, 1994

Estimated economic value: $16,857,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Photoresist composition, coated substrate including the photoresist composition,2024
Photoresist composition, coated substrate including the photoresist composition,2023
Photoresists comprising carbamate component2020
Photoacid generator2019
Photoacid generator2019
Photoacid-generating compound, polymer derived therefrom, photoresist compositio2018
Storage cartridge dock system2017
Photoacid generator and photoresist comprising same2015
Photoacid generator and photoresist comprising same2015
Photoacid generator and photoresist comprising same2014
Integrated circuit with test pad structure and method of testing2005
Semiconductor wafer contact system and method for contacting a semiconductor waf1998