Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for integrated circuit diagnosis

Method and apparatus for integrated circuit diagnosis

US Patent 5325309 · Granted Jun 28, 1994

Estimated economic value: $14,316,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Detection of semiconductor failures by photoemission and electron beam testing1992