Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Manufacturing method including near-field optical microscopic examination of a semiconductor wafer

Manufacturing method including near-field optical microscopic examination of a semiconductor wafer

US Patent 5288999 · Granted Feb 22, 1994

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Imaging system for detection of intraoperative contrast agents in tissue2024
High-resolution, real-time imaging with adaptive optics and lattice light sheets2024
Optical microscopy with phototransformable optical labels2024
Systems and methods for detection2023
Biopsy device for coherent Raman imaging2022
High-resolution, real-time imaging with adaptive optics and lattice light sheets2022
Systems and methods for detection2021
Optical microscopy with phototransformable optical labels2021
Microscopy with structured plane illumination and point accumulation for imaging2020
Molecular detection using ligation amplification2020
Biopsy device for coherent Raman imaging2020
Structured plane illumination microscopy2020