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Home › Microwave measuring apparatus for continuously and without contact measuring the thickness of a thin conducting layer of a running insulating support such as a fiber or a tape

Microwave measuring apparatus for continuously and without contact measuring the thickness of a thin conducting layer of a running insulating support such as a fiber or a tape

US Patent 5241279 · Granted Aug 31, 1993

Estimated economic value: $1,622,000 ⓘ

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