Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Compact temperature-compensated tube-type scanning probe with large scan range and independent x, y, and z control

Compact temperature-compensated tube-type scanning probe with large scan range and independent x, y, and z control

US Patent 5173605 · Granted Dec 22, 1992

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

On-axis dynamic interferometer and optical imaging systems employing the same2022
Systems and processes for transforming and displaying accounting and financial i2013
Multilayer extruded seal and method for manufacturing such seal2012
Chromatic compensation in Fizeau interferometer2009
Extruded seal having a corrugated axial surface, a method of manufacturing such 2009
Extruded binary seal2009
Pixelated phase-mask interferometer2007
Common optical-path testing of high-numerical-aperture wavefronts2006
Autocollimator with grating1999
System for eliminating scattered light in autocollimator for magnetic-head suspe1999
Interchangeable sample stage with integral reference surface for magnetic-head s1998
Interchangeable sample stage with integral reference surface for magnetic-head s1998