Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Semiconductor memory with multiple clocking for test mode entry

Semiconductor memory with multiple clocking for test mode entry

US Patent 5161159 · Granted Nov 3, 1992

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Reliable non-volatile memory download approach2025
MEMS gyroscope start-up process and circuit2025
MEMS gyroscope control circuit2024
MEMS gyroscope self-test using a technique for deflection of the sensing mobile 2023
MEMS gyroscope control circuit2023
MEMS accelerometer self-test using an active mobile mass deflection technique2022
MEMS gyroscope self-test using a technique for deflection of the sensing mobile 2022
MEMS gyroscope control circuit2021
Test mode circuitry for a programmable tamper detection circuit2014
Robust SRAM memory cell capacitor plate voltage generator2014
Robust SRAM memory cell capacitor plate voltage generator2013
Test mode circuitry for a programmable tamper detection circuit2011