Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals

Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals

US Patent 5142224 · Granted Aug 25, 1992

Estimated economic value: $4,398,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Trench gate MOSFET2016
Hybrid DC-to-AC conversion system and method of operating the same2015
Trench gate MOSFET2015
DC-to-AC power conversion system and method of operating the same2015
Method of forming a trench gate MOSFET having a thick bottom oxide2015
Power management apparatus and method of operating the same2015
Method of forming a trench gate MOSFET having a thick bottom oxide2015
Inverter for preventing leak current2014
DC-AC converter2013
High efficiency, high frequency amplifiers2013
High-voltage semiconductor device structure2009
High voltage laterally double-diffused metal oxide semiconductor2006