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Home › Device for the dielectric characterization of samples made of a material having a flat or uneven surface and application for the non-destructive control of the dielectric homogeneity of said samples

Device for the dielectric characterization of samples made of a material having a flat or uneven surface and application for the non-destructive control of the dielectric homogeneity of said samples

US Patent 5077522 · Granted Dec 31, 1991

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