Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for measuring trigger and latchback voltage of a semiconductor device

Method and apparatus for measuring trigger and latchback voltage of a semiconductor device

US Patent 5057780 · Granted Oct 15, 1991

Estimated economic value: $13,046,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Power amplifying apparatus2007
Device power supply and IC test apparatus2004
High output amplifier for stable operation2004
Prober interface card for shortening the settling time1999
Prober interface card for shortening the settling time1999
Switching apparatus with current limiting circuit1999
Method and apparatus for measuring the breakdown voltage of semiconductor device1994
Apparatus and method for measuring hysteresis characteristics in a high frequenc1993
Pulsed power supply for determining breakdown voltage1990
Pulsed power supply for determining breakdown voltage1990
Apparatus for measuring time variant device impedance1984