Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Diffraction encoded position measuring apparatus

Diffraction encoded position measuring apparatus

US Patent 5050993 · Granted Sep 24, 1991

Estimated economic value: $6,349,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Adaptive optics systems using pixelated spatial phase shifters2011
Spectrum analyzer device on a chip2009
Black fringe wavefront sensor2007
Heterodyne frequency modulated signal demodulator and method of operating the sa2006
Method and apparatus for controlling a fiber optic phased array utilizing freque2004
Apparatus and method for the recording and readout of multiple exposure hologram1987
Phase-measuring interferometer1986