Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Device having an exchangeable substrate sleeve for measuring layer thickness

Device having an exchangeable substrate sleeve for measuring layer thickness

US Patent 5046849 · Granted Sep 10, 1991

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Steel tool provided with a boron layer1993
Method of manufacturing tube glass1993
Method of applying a boron layer to a steel substrate by a CVD process1992
Passive fiber-optic component1991
Irradiation device comprising a short arc discharge lamp1988
Method of manufacturing a plurality of optical components1988
Method of manufacturing a passive fiber optic component1987
Position sensor having at least two layers of light conductors1986
Method of producing an optical fiber having a core which has a noncircular cross1983
Method of making an electric resistor having a resistance body consisting of sil1980