Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Built-in self test method for application specific integrated circuit libraries

Built-in self test method for application specific integrated circuit libraries

US Patent 4949341 · Granted Aug 14, 1990

Estimated economic value: $5,397,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System, method, and apparatus for generating and digitally processing a head rel2021
RF channel amplification module with instantaneous power limiting function2015
Multimode voltage regulator and method for providing a multimode voltage regulat2013
Methods and apparatus for extending semiconductor chip testing with boundary sca2008
Methods and apparatus for incorporating IDDQ testing into logic BIST2007
Logic circuit for reliability and yield enhancement1993
Logic circuit for reliability and yield enhancement1993
Bi-directional switching circuit1985