Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of measurement by scanning tunneling microscope

Method of measurement by scanning tunneling microscope

US Patent 4902892 · Granted Feb 20, 1990

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Information processing apparatus2025
Piezoelectric stack, piezoelectric element, and method of manufacturing piezoele2025
Vehicle lamp information notification device, vehicle lamp information notificat2025
Conductive wire, method for manufacturing conductive wire, casting conductive wi2025
Laminated substrate having piezoelectric film, element having piezoelectric film2023
Piezoelectric stack, piezoelectric element, and method of manufacturing piezoele2023
Piezoelectric laminate, method of manufacturing piezoelectric laminate and piezo2023
Laminated substrate having piezoelectric film, element having piezoelectric film2023
Scanning probe microscope and setting method thereof2022
Piezoelectric laminate, method of manufacturing the piezoelectric laminate and p2022
Information processing apparatus and information processing system2022
Laminated substrate with piezoelectric thin film, piezoelectric thin film elemen2021