Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for in-circuit testing of electronic devices

Method and apparatus for in-circuit testing of electronic devices

US Patent 4862067 · Granted Aug 29, 1989

Estimated economic value: $8,347,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and apparatus for identifier matching and management2022
System and method for processing and for funding a transaction2022
Systems and methods for real-time video transcoding of streaming image data2021
System and method for processing and for funding a transaction2018
System and method for managing related accounts2014
Offer placement system and methods for targeted marketing offer delivery system2013
System and methods for delivering targeted marketing offers to consumers via an 2013
System and methods for merging or injecting targeted marketing offers with a tra2013
Method and apparatus for testing integrated circuits1988