Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus for measuring reflectivity

Apparatus for measuring reflectivity

US Patent 4838695 · Granted Jun 13, 1989

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Structured substrates for optical surface profiling2022
Structured substrates for optical surface profiling2020
Structured substrates for optical surface profiling2017
Aryl di-substituted propenone compounds2014
Reconfigurable optical add-drop multiplexers employing polarization diversity2011
Resonant cavity biosensor2010
Rhamnose binding protein2008
Reconfigurable optical add-drop multiplexers employing polarization diversity2007
Free-space dynamic wavelength routing systems with interleaved channels for enha2007
High density analog recording using write symbols having distinguishable readout2006
Rhamnose binding protein2005
Reconfigurable optical add-drop multiplexers employing polarization diversity2004