Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › High density, high performance, single event upset immune data storage cell

High density, high performance, single event upset immune data storage cell

US Patent 4797804 · Granted Jan 10, 1989

Estimated economic value: $39,782,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Buried power grid designs for improved radiation hardness in CMOS technologies2014
Method for fabricating resistors within semiconductor integrated circuit devices2004
CMOS SRAM cell with prescribed power-on data state2003
High-performance high-density CMOS SRAM cell2003
Low-power CMOS device and logic gates/circuits therewith2002
Single-event upset hardened reconfigurable bi-stable CMOS latch2002
Soft error resistant data storage cells1989
Fast writing circuit for a soft error protected storage cell1987
Pulse duration modulator using charge coupled devices1985
Quantizing circuits using a charge coupled device with a feedback channel1983
Quantizing circuits1981
CCD A-to-D converter1980